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Erdong LU and Pengshou XU(Hefei National Synchrotron Radiation Lab. , University of Science and Technology of China , Hefei , 230026 , China)Mingrong JI , Maosheng MA and Xianming LIU(Structure Research Lab. , University of Science and Technology of China , Hefe
材料科学技术（英）
The natural passive films forrned on Fe_(40)Ni_(40)P_(14)B_6 and Fe_(54.6)Ni_(38)Si_(4.1)B_(2.3)V_1 amorphous alloys long-term exposed in air have been studied by X-ray photoelectron spectroscopy (XPS) and Auger electron (including Ar+ ion depth profiling) spectroscopy (AES). The following aspects have been investigated: (1) chemical states of the elements in the films. binding energies and the chemical shifts measured by XPSf (2) structure and composition of the films fand (3) thickness of the passive films determined by AES depth profiling and XPS analysis.
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